Hybrid Event- Complex Electronics Reliability and Life Modeling Based on Physics of failure Simulation

Complex electronics systems and components are subject to various stressors and uncertainties that can affect their reliability and performance over time. Traditional reliability assessment methods, such as statistical models, MTBF estimations, and testing, may not be able to capture the complex interactions and dependencies among the system elements and the failure mechanisms. Physics of failure is an alternative approach that uses physics-based modeling and simulation to understand the root causes of failure, such as device degradation, fatigue, fracture, wear, and corrosion, and to predict the system reliability and life expectancy under different operating conditions and environments. It can also estimate the remaining useful life and the state of degradation of the system. Physics of failure can also incorporate probabilistic methods to account for the uncertainties and variabilities in the system parameters, materials properties, loading conditions, and failure mechanisms. In this presentation, we will present the foundation and methods of physics of failure-based tools for reliability modeling of complex electronics systems and components and demonstrate how they can be applied to various domains. We will also discuss the advantages and limitations of the physics of failure-based reliability modeling and compare it with other reliability assessment methods. The capabilities of Ansys Sherlock will be demonstrated for electronics physics of failure. Speaker(s): Mohammad Pourgol, Agenda: 5:00 PM Networking 5:30 PM Technical Presentation 7:15 PM Questions and Answers 7:30 PM Adjournment Bldg: Main Cafeteria, Lincoln Laboratory, 244 Wood St, Lexington, MA 02421, Massachusetts, United States, Virtual: https://events.vtools.ieee.org/m/381012