Co-sponsored by: Cindy Conde EMBS is a organization member of NH High Tech Council, Biotech/Medtch Cluster Agenda: Discuss 2018 planning Location: Nashua, New Hampshire

Co-sponsored by: Kat Reagan Executive Committee Meeting. Open to all IEEE members. Come out to learn about what's going on in the section. Agenda: Dinner at 6:00PM Call to Order at 6:30PM (Chair) Introductions Approve minutes from past meeting (Secretary) Agenda items requiring a vote - to be determined Old Business New Business Open Forum Discussion Location: Bldg: Great Buffet Restaurant 1525 South Willow Street Manchester, New Hampshire 03103

Co-sponsored by: Kat Reagan Executive Committee Meeting. Open to all IEEE members. Come out to learn about what's going on in the section. Agenda: Dinner at 6:00PM Call to Order at 6:30PM (Chair) Introductions Approve minutes from past meeting (Secretary) Agenda items requiring a vote - to be determined Old Business New Business Open Forum Discussion Location: Bldg: Great Buffet Restaurant 1525 South Willow Street Manchester, New Hampshire 03103

Co-sponsored by: NHHTC The BioTech/MedTech Cluster, an initiative of the New Hampshire High Tech Council (Council), will host this regional event  focusing on activities at the Advanced Regenerative Manufacturing Institute (ARMI). Event to focus on ARMI impact with keynote speaker Dean Kamen, Gray Chynoweth and Tom Bollenbach Speaker(s): Dean Kamen, Location: Room: DEKA Auditorium 400 Commercial Street Manchester, New Hampshire 03101

Co-sponsored by: NHHTC The BioTech/MedTech Cluster, an initiative of the New Hampshire High Tech Council (Council), will host this regional event  focusing on activities at the Advanced Regenerative Manufacturing Institute (ARMI). Event to focus on ARMI impact with keynote speaker Dean Kamen, Gray Chynoweth and Tom Bollenbach Speaker(s): Dean Kamen, Location: Room: DEKA Auditorium 400 Commercial Street Manchester, New Hampshire 03101

Co-sponsored by: Association of Old Crows, New Hampshire Chapter Everything You Can Do With Vector Nonlinear Microwave Measurements The advent of nonlinear vector network analyzers (NVNA) has stimulated the introduction of new paradigms in microwave engineering for (1) the measurement, (2) the modeling and (3) the design of nonlinear microwave circuits such as microwave power amplifiers and oscillators. This talk will start with a review of vector large-signal microwave measurements for the acquisition of the phases and amplitudes of the multi-harmonic incident and reflected waves at the ports of a nonlinear device. The various types of NVNA architecture available, the procedure used to calibrate them and the calibration traceability will be presented. Next the behavioral models used for the representation of the measured multi-tone multiharmonic data will be reviewed. This will include the general multi-harmonic Volterra functions for CW periodic nonlinear RF excitations, the X-parameter/S-function approximations for mildly nonlinear RF excitations and their extension for modulated multi-harmonic signals. Circuit-based nonlinear microwave models can also be directly extracted from largesignal measurements for a targeted range of operation. Examples of SOS-MOSFET and GaN models extracted and verified using a few real-time active load pull (RTALP) measurements will be presented. The efficient phase sweeping of the RTALP drastically reduces the number of large-signal measurements needed for the model development and verification while maintaining the same intrinsic voltage coverage as in conventional passive or active load–pull systems. The bias dependence of the charges and device IV characteristics can then be simultaneously extracted from these large-signal RF measurements using artificial neural networks (ANN). NVNA’s also find application in the design of power amplifiers (PA). To optimize the power efficiency of PAs, specific internal modes of operation are usually targeted at the device current source reference planes as estimated using nonlinear deembedding. However given the tremendous large search space for the multi-harmonic terminations for waveform engineering, it is beneficial to first use a nonlinear embedding device model to predict from the desired internal mode of operation, the required amplitude and phase of the multi-harmonic incident waves at the transistor measurement reference planes. The verification of the resulting amplifier power efficiency optimization can then be performed using NVNA measurements. Examples of such design for Doherty and Chireix amplifiers will be presented. Finally in addition to CW signals, pulsed or modulated signals can also be measured by NVNAs. This is particularly important for nonlinear devices such SOS-MOSFET or GaN HEMTs which are affected by various low-frequency memory effects such as parasitic bipolar junction transistor effects, self-heating, and cyclostationary charging of traps. Recent techniques reported for low-duty rate pulsed and modulated RF NVNA measurements will then be reviewed to shine new light in the time-varying response of transistors excited by high peak to average power ratio (PAPR) modulated signals. Speaker(s): Prof. Patrick Roblin, Agenda: 6:00 to 6:30  Social 6:30 to 8:00  Presentation Location: Nashua Country Club 25 Fairway Street Nashua, New Hampshire 03060

Co-sponsored by: Association of Old Crows, New Hampshire Chapter / IEEE MTT-S Boston Chapter / IEEE MTT-S NH Chapter Everything You Can Do With Vector Nonlinear Microwave Measurements The advent of nonlinear vector network analyzers (NVNA) has stimulated the introduction of new paradigms in microwave engineering for (1) the measurement, (2) the modeling and (3) the design of nonlinear microwave circuits such as microwave power amplifiers and oscillators. This talk will start with a review of vector large-signal microwave measurements for the acquisition of the phases and amplitudes of the multi-harmonic incident and reflected waves at the ports of a nonlinear device. The various types of NVNA architecture available, the procedure used to calibrate them and the calibration traceability will be presented. Next the behavioral models used for the representation of the measured multi-tone multiharmonic data will be reviewed. This will include the general multi-harmonic Volterra functions for CW periodic nonlinear RF excitations, the X-parameter/S-function approximations for mildly nonlinear RF excitations and their extension for modulated multi-harmonic signals. Circuit-based nonlinear microwave models can also be directly extracted from largesignal measurements for a targeted range of operation. Examples of SOS-MOSFET and GaN models extracted and verified using a few real-time active load pull (RTALP) measurements will be presented. The efficient phase sweeping of the RTALP drastically reduces the number of large-signal measurements needed for the model development and verification while maintaining the same intrinsic voltage coverage as in conventional passive or active load–pull systems. The bias dependence of the charges and device IV characteristics can then be simultaneously extracted from these large-signal RF measurements using artificial neural networks (ANN). NVNA’s also find application in the design of power amplifiers (PA). To optimize the power efficiency of PAs, specific internal modes of operation are usually targeted at the device current source reference planes as estimated using nonlinear deembedding. However given the tremendous large search space for the multi-harmonic terminations for waveform engineering, it is beneficial to first use a nonlinear embedding device model to predict from the desired internal mode of operation, the required amplitude and phase of the multi-harmonic incident waves at the transistor measurement reference planes. The verification of the resulting amplifier power efficiency optimization can then be performed using NVNA measurements. Examples of such design for Doherty and Chireix amplifiers will be presented. Finally in addition to CW signals, pulsed or modulated signals can also be measured by NVNAs. This is particularly important for nonlinear devices such SOS-MOSFET or GaN HEMTs which are affected by various low-frequency memory effects such as parasitic bipolar junction transistor effects, self-heating, and cyclostationary charging of traps. Recent techniques reported for low-duty rate pulsed and modulated RF NVNA measurements will then be reviewed to shine new light in the time-varying response of transistors excited by high peak to average power ratio (PAPR) modulated signals. Speaker(s): Prof. Patrick Roblin, Agenda: 6:00 to 6:30  Social 6:30 to 8:00  Presentation Location: Nashua Country Club 25 Fairway Street Nashua, New Hampshire 03060

Co-sponsored by: Association of Old Crows, New Hampshire Chapter Everything You Can Do With Vector Nonlinear Microwave Measurements The advent of nonlinear vector network analyzers (NVNA) has stimulated the introduction of new paradigms in microwave engineering for (1) the measurement, (2) the modeling and (3) the design of nonlinear microwave circuits such as microwave power amplifiers and oscillators. This talk will start with a review of vector large-signal microwave measurements for the acquisition of the phases and amplitudes of the multi-harmonic incident and reflected waves at the ports of a nonlinear device. The various types of NVNA architecture available, the procedure used to calibrate them and the calibration traceability will be presented. Next the behavioral models used for the representation of the measured multi-tone multiharmonic data will be reviewed. This will include the general multi-harmonic Volterra functions for CW periodic nonlinear RF excitations, the X-parameter/S-function approximations for mildly nonlinear RF excitations and their extension for modulated multi-harmonic signals. Circuit-based nonlinear microwave models can also be directly extracted from largesignal measurements for a targeted range of operation. Examples of SOS-MOSFET and GaN models extracted and verified using a few real-time active load pull (RTALP) measurements will be presented. The efficient phase sweeping of the RTALP drastically reduces the number of large-signal measurements needed for the model development and verification while maintaining the same intrinsic voltage coverage as in conventional passive or active load–pull systems. The bias dependence of the charges and device IV characteristics can then be simultaneously extracted from these large-signal RF measurements using artificial neural networks (ANN). NVNA’s also find application in the design of power amplifiers (PA). To optimize the power efficiency of PAs, specific internal modes of operation are usually targeted at the device current source reference planes as estimated using nonlinear deembedding. However given the tremendous large search space for the multi-harmonic terminations for waveform engineering, it is beneficial to first use a nonlinear embedding device model to predict from the desired internal mode of operation, the required amplitude and phase of the multi-harmonic incident waves at the transistor measurement reference planes. The verification of the resulting amplifier power efficiency optimization can then be performed using NVNA measurements. Examples of such design for Doherty and Chireix amplifiers will be presented. Finally in addition to CW signals, pulsed or modulated signals can also be measured by NVNAs. This is particularly important for nonlinear devices such SOS-MOSFET or GaN HEMTs which are affected by various low-frequency memory effects such as parasitic bipolar junction transistor effects, self-heating, and cyclostationary charging of traps. Recent techniques reported for low-duty rate pulsed and modulated RF NVNA measurements will then be reviewed to shine new light in the time-varying response of transistors excited by high peak to average power ratio (PAPR) modulated signals. Speaker(s): Prof. Patrick Roblin, Agenda: 6:00 to 6:30  Social 6:30 to 8:00  Presentation Location: Nashua Country Club 25 Fairway Street Nashua, New Hampshire 03060

Co-sponsored by: Association of Old Crows, New Hampshire Chapter / IEEE MTT-S Boston Chapter / IEEE MTT-S NH Chapter Everything You Can Do With Vector Nonlinear Microwave Measurements The advent of nonlinear vector network analyzers (NVNA) has stimulated the introduction of new paradigms in microwave engineering for (1) the measurement, (2) the modeling and (3) the design of nonlinear microwave circuits such as microwave power amplifiers and oscillators. This talk will start with a review of vector large-signal microwave measurements for the acquisition of the phases and amplitudes of the multi-harmonic incident and reflected waves at the ports of a nonlinear device. The various types of NVNA architecture available, the procedure used to calibrate them and the calibration traceability will be presented. Next the behavioral models used for the representation of the measured multi-tone multiharmonic data will be reviewed. This will include the general multi-harmonic Volterra functions for CW periodic nonlinear RF excitations, the X-parameter/S-function approximations for mildly nonlinear RF excitations and their extension for modulated multi-harmonic signals. Circuit-based nonlinear microwave models can also be directly extracted from largesignal measurements for a targeted range of operation. Examples of SOS-MOSFET and GaN models extracted and verified using a few real-time active load pull (RTALP) measurements will be presented. The efficient phase sweeping of the RTALP drastically reduces the number of large-signal measurements needed for the model development and verification while maintaining the same intrinsic voltage coverage as in conventional passive or active load–pull systems. The bias dependence of the charges and device IV characteristics can then be simultaneously extracted from these large-signal RF measurements using artificial neural networks (ANN). NVNA’s also find application in the design of power amplifiers (PA). To optimize the power efficiency of PAs, specific internal modes of operation are usually targeted at the device current source reference planes as estimated using nonlinear deembedding. However given the tremendous large search space for the multi-harmonic terminations for waveform engineering, it is beneficial to first use a nonlinear embedding device model to predict from the desired internal mode of operation, the required amplitude and phase of the multi-harmonic incident waves at the transistor measurement reference planes. The verification of the resulting amplifier power efficiency optimization can then be performed using NVNA measurements. Examples of such design for Doherty and Chireix amplifiers will be presented. Finally in addition to CW signals, pulsed or modulated signals can also be measured by NVNAs. This is particularly important for nonlinear devices such SOS-MOSFET or GaN HEMTs which are affected by various low-frequency memory effects such as parasitic bipolar junction transistor effects, self-heating, and cyclostationary charging of traps. Recent techniques reported for low-duty rate pulsed and modulated RF NVNA measurements will then be reviewed to shine new light in the time-varying response of transistors excited by high peak to average power ratio (PAPR) modulated signals. Speaker(s): Prof. Patrick Roblin, Agenda: 6:00 to 6:30  Social 6:30 to 8:00  Presentation Location: Nashua Country Club 25 Fairway Street Nashua, New Hampshire 03060

Co-sponsored by: NCC IEEE Student Branch Abstract:  Cybersecurity is a wide and growing field. Many of our personal security habits feed into our daily work lives. As technology continues to integrate into our daily lives, we become more susceptible to vulnerabilities inherent in cyberspace. Technology influences every aspect of our lives from personal communications to the critical infrastructure that provides us the basics needs of modern life. As citizens in a global technical society, we must be diligent and proactive to protect ourselves Speaker(s): Professor Peter Kurek, Agenda: 5:30 - Network 5:35 - Pizza 5:40 - Technical Talk 6:30 - Informal Discussion Location: Room: McIntyre Room (WCCR) Bldg: Wellness Center 505 Amherst St Nashua, New Hampshire 03063