Material properties affect the performance of electronic devices. Material characterization techniques can be used to analyze a wide range of properties. Mainly, we will focus on Scanning Electron Microscope (SEM) based techniques that are commonly used to characterize materials. For example, Energy Dispersive Spectrometry (EDS) is used to identify chemistry distribution within a surface while Electron Backscatter Diffraction (EBSD) provides information about the grain size, crystal structure and orientation, among others. This presentation will offer an overview of some characterization techniques, discussing how the techniques work and what information can be obtained from them. Some examples of applications will be shared to illustrate how they can solve research problems. Speaker(s): Alfredo Díaz González, Agenda: 5:30 PM Networking 6:00 PM Technical Presentation 6:45 PM Questions and Answers 7:00 PM Adjournment Bldg: Main Cafeteria, Lincoln Laboratory, 244 Wood St, Lexington, MA 02421, Massachusetts, United States, Virtual: https://events.vtools.ieee.org/m/371485