This is our year-end technical meeting and dinner honoring our past Chapter Chairs. Abstract We will begin with a brief overview of radiation effects in electronics, and their effect on reliability. Then we will cover the history of the discovery and our growing awareness of them, with special attention paid to the place of the Harvard Cyclotron Laboratory (HCL)/Massachusetts General Hospital (MGH) Rad Test program in that history. We will then look at what factors made HCL so prominent in the early work of understanding these effects, and why the re-purposing of equipment built at HCL for the MGH program was particularly useful in electronics reliability testing. Finally, we will finish with a few words on the future of the MGH test program. Speaker(s): Ethan Cascio Agenda: PLEASE NOTE THE NEW 5PM START TIME FOR THIS MEETING 5:00 PM Networking and light dinner 5:30 PM Technical Presentation 7:00 PM Questions and Answers 7:15 PM Informal Q&A and networking 7:30 PM Adjournment Bldg: Main Cafeteria, Lincoln Laboratory, 244 Wood St, Lexington, Massachusetts, United States, 02421, Virtual: https://events.vtools.ieee.org/m/420285