AI Talks with Coffee/Tea No:III

Room: Art Room (knock on window if needed), 50 Woodmont Ave, Enter under Sky Bridge, Londonderry, New Hampshire, United States

This is AI Talks with Coffee and Tea No:III We will place an agenda for the AI topics. Best regards [] Agenda: I will place an agenda here. Best regards Room: Art Room (knock on window if needed), 50 Woodmont Ave, Enter under Sky Bridge, Londonderry, New Hampshire, United States

Hybrid – Adam Bahret Presents…Perfect Accelerated Life Testing!

Bldg: Building 6, ASMPT NEXX, 900 Middlesex Turnpike, Billerica, Massachusetts, United States, 01821, Virtual: https://events.vtools.ieee.org/m/415811

FREE In Person and Virtual Event Measuring the Reliability of new technology is critical for any development team. Accelerated Life Testing (ALT) measures a new product’s life by testing at elevated stresses. It saves valuable time & resources; giving teams the right information rapidly. Join this webinar to get an overview of ALT and a few tips and tricks to ensure you avoid common pitfalls. Speaker(s): Adam Bahret, Agenda: 5:30 PM Pizza, salad, soft drinks, and Networking 6:00 PM Technical Presentation 6:45 PM Questions and Answers 7:00 PM Adjournment Bldg: Building 6, ASMPT NEXX, 900 Middlesex Turnpike, Billerica, Massachusetts, United States, 01821, Virtual: https://events.vtools.ieee.org/m/415811

Hybrid – Radiation Effects in Electronics: Brief Overview and History

Bldg: Main Cafeteria, Lincoln Laboratory, 244 Wood St, Lexington, Massachusetts, United States, 02421, Virtual: https://events.vtools.ieee.org/m/420285

We will begin with a brief overview of radiation effects in electronics, and their effect on reliability. Then we will cover the history of the discovery and our growing awareness of them, with special attention paid to the place of the Harvard Cyclotron Laboratory (HCL)/Massachusetts General Hospital (MGH) Rad Test program in that history. We will then look at what factors made HCL so prominent in the early work of understanding these effects, and why the re-purposing of equipment built at HCL for the MGH program was particularly useful in electronics reliability testing. Finally, we will finish with a few words on the future of the MGH test program. Speaker(s): Ethan Cascio Agenda: 5:30 PM Pizza, salad, soda, and Networking 6:00 PM Technical Presentation 6:45 PM Questions and Answers 7:00 PM Adjournment Bldg: Main Cafeteria, Lincoln Laboratory, 244 Wood St, Lexington, Massachusetts, United States, 02421, Virtual: https://events.vtools.ieee.org/m/420285